Submit your article online with SAGETRACK!
SAGETRACK makes it easy to:
- Submit your article online
- Submit revisions and resubmissions through automatic linking
- Track the progress of your article online
- Publish faster with APM!
Visit http://mc.manuscriptcentral.com/apm
NEWS FROM THE EDITOR!
November 12, 2007--After a review of our manuscript flow, it is with great pleasure that we announce an expansion of Applied Psychological Measurement. In 2008 and beyond, the number of issues in each volume will increase from six to eight.
Several goals will be achieved with this increase:
1. The increase will facilitate more timely publication of manuscripts.
2. It will increase our capacity to publish the kind of manuscripts that seldom appear in
APM, such as critical reviews of literature.
3. It will increase the number of worthy manuscripts that can be accepted.
We want to thank all of you who have supported the journal in the past through your readership, submission of manuscripts, and editorial review of submissions. Your efforts have made this expansion possible.
--Mark L. Davison, Editor, and Margaret Ferdinand, Managing Editor
For over twenty-five years, Applied Psychological Measurement has led the measurement field in presenting cutting-edge methodologies and related empirical research. Whether the setting is educational, organizational, industrial, social or clinical, Applied Psychological Measurement focuses on ways to use the most current techniques to address measurement problems in the behavioral and social sciences.
Broad Coverage
Applied Psychological Measurement provides a complete picture of the measurement discipline. Its wide range of features keep you informed of all the latest developments that shape this evolving field of study. Among the features you'll find in its pages are
- articles reporting the latest empirical research and methodological developments
- brief reports of exploratory, small-sample, or replication studies
- computer program reviews of commercially available software packages used in applied measurement
- book reviews of important new publications
- announcements of statistical and measurement meetings, symposia and workshops
To view the topics covered in APM over the years, please view our comprehensive 25-year subject and author index under the Announcements link on the left hand menu.
Special Issues
Applied Psychological Measurement regularly supplements its broad scope with Special Issues, guest edited by leading scholars, devoted to a single topic of emerging importance in measurement. Recent and forthcoming Special Issues focus on such topics as:
- Polytomous item response theory
- Latest developments in multidimensional item response theory
- Optimal test assembly
Diverse Topics
From discussion of innovative measuring techniques to studies of validity and reliability methods, each issue of Applied Psychological Measurement features the most current explorations of measurement problems and solutions. Some of the important topics frequently covered in Applied Psychological Measurement include: item response theory; test equations and linking; reliability theory and methods; differential item functioning; measurement of change; algorithmic test construction; unidimensional and multidimensional scaling; validity methodology; computerized adaptive testing; Rasch models; person fit; and generalizability theory and methods.
International Perspective
Leading authorities in scholarly publication regularly rank Applied Psychological Measurement among the top journals in quantitative psychology. APM is one of the few journals in the field that presents a truly international perspective on measurement, publishing articles contributed by researchers from around the globe. Worldwide respect and renown is further enhanced through a strong partnership with SAGE Publications, an international leader in social and behavioral science publications.
Thomson Reuters 2008 Journal Citation Reports®
2008 Ranking:
10/11 in Psychology, Mathematical
29/37 in Social Sciences, Mathematical Methods
2008 Impact Factor: 0.574
